Eventually, ions can be extracted from the machine by applying a deflection mechanism on the ions. Typically, the deflection allows ions to be extracted at any point in the machine. In order to ensure the ions are captured effectively, ions with the maximum amount of energy are deflected (Vorobiev &York, 3).
The captured ions have to be shielded from the effects of the electric and magnetic fields using a mechanism that allows a separator or a septum working in tandem with an electrode with an image charge current to shield the ions from the effects of the electric and magnetic fields.
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